标签：解释 crc increase last 编程 failure record cts win
intel SSD Toolbox SMART信息
解释：
03 – Spin Up Time （磁头加载时间）
The average time it takes the spindle to spin up. Since an SSD has no moveable
parts, this attribute reports a fixed raw value of zero (0) and a fixed normalized
value of 100. Use the Raw value for this attribute.
（SSD没这东西，所以这个值 固定为0）
04 – Start/Stop Count （开始/停止计数）
This type of event is not an issue for SSDs. However, hard disk drives can
experience only a finite number of these events and, therefore, must be tracked.
This attribute reports a fixed value of zero (0) and a fixed normalized value of 100.
Use the Raw value for this attribute.
（不知道，反正数值无意义）
05 – Re-Allocated Sector Count （重映射扇区数）
This attribute shows the number of retired blocks since leaving the factory (also
known as a grown defect count).
The lithography (litho) of your drive determines which count you should use. Refer
to the drive name in the Select a Drive section. A ―1‖ in the twelfth position
indicates a 50nm drive, while a ―2‖ indicates a 34nm. For example in Figure 22:
SSDSA2M160G2GN indicates a 34nm drive.
For 50nm drives, the normalized value has an initial value of 100 but counts up from
1 for every 4 grown defects. The normalized value of this attribute becomes 1 when
there are 4 grown defects; the value is 2 when there are 8 grown defects, etc. See
the following table for details.
（随着重映射扇区数的增长而增加【G1，G2不同】）
09 – Power-On Hours Count （通电时间）
This attribute reports the cumulative number of power-on hours over the life of the
device. Use the Raw value for this attribute.
Note: The On/Off status of the device initiated power management (DIPM) feature affects
the number of hours reported.
If DIPM is turned ―On‖, the recorded value for power-on hours does not include
the time that the device is in a ―slumber‖ state.
If DIPM is turned ―Off‖, the recorded value for power-on hours should match the
clock time, as all three device states are counted: active, idle and slumber.
（累积通电时间）
0C – Power Cycle Count （通断电次数）
This attribute reports the cumulative number of power cycle events (power on/off
cycles) over the life of the device. Use the Raw value for this attribute.
（开关机的次数）
C0 – Unsafe Shutdown Count （异常关机次数）
This attribute reports the cumulative number of unsafe (unclean) shutdown events
over the life of the device. An unsafe shutdown occurs whenever the device is
powered off without STANDBY IMMEDIATE being the last command. Use the Raw
value for this attribute.
（非正常断电后增长）
E1 – Host Writes （数据写入量）
This attribute reports the total number of sectors written by the host system. The
raw value is increased by 1 for every 65,536 sectors written by the host. Use the
Raw value for this attribute.
（SSD数据写入量）
E8 – Available Reserved Space （可用预留空间）
This attribute reports the number of reserve blocks remaining. The attribute value
begins at 100 (64h), which indicates that the reserved space is 100 percent
available. The threshold value for this attribute is 10 percent availability, which
indicates that the drive is close to its end of life. Use the Normalized value for this
attribute.
（这个算是颗粒寿命，等于低于10%SSD就离躺倒不远了）
E9 – Media Wearout Indicator （闪存磨耗指数）
This attribute reports the number of cycles the NAND media has experienced.
The normalized value declines linearly from 100 to 1 as the average erase cycle
count increases from 0 to the maximum rated cycles.
Once the normalized value reaches 1, the number does not decrease, although it is
likely that significant additional wear can be put on the device. Use the Normalized
value for this attribute.
（如E8上面，等到低于10%，在没有预留可用空间的情况下，跌的可快了呢- -）
B8 – End to End Error Detection Count （端对端错误监测数）
This attribute is only available for 34nm, G2 drives and counts the number of times
errors are encountered during logical block addressing (LBA) tag checks on the data
path within the drive. Use the Normalized value for this attribute.
（LBA映射错误增长的数值？）
2. SandForce
SandForce 12xx/15xx 主控的SMART定义可以由SFtoolbox查看。点我下载
SandForce的SMART定义在几次更新固件后做了点小修改，所以固件不同可能有差别。
大致定义的详细解释如下：
ID 属性 解释
1 Raw Read Error Rate 底层数据读取出错率
5 Retired Block Count 不可使用的坏块计数 （公式比较怪。。这个值不准，新固件都为100）
9 Power On Hours Count 累计加电时间
12 Power Cycle Count 设备通电周期
171 Program Fail Count 编程错误计数
172 Erase Fail Count 擦除错误计数
174 Unexpected Power Loss Count 不正常掉电次数
177 Wear-Range Data 显示最大磨损块和最小磨损块相差的百分比
181 同171定义相同
182 同172定义相同
187 Reported Uncorrectable Errors 不可修复错误计数
194 显示温度的，基本可以忽略（假的）
195 On the Fly Reported Uncorrectable Error Count 实时不可修复错误计数
196 Reallocated Event Count 重映射坏块计数
231 SSD Life left SSD剩余寿命
新盘为100，当显示为10，代表P/E用完了，但是还有备用空间可以替换，显示0代表盘上数据为只读。
241 lifetime write froms host 来自主机的写入数据量总数（64G更新一次）
242 lifetime write froms host 来自主机的读取数据量总数（64G更新一次）
对于SandForce主控的SMART,我感觉作为用户只要密切关注241,242两个值就能知道自己读写了多少数据，关注231值的变化大致判断解剩余寿命。
3. Micron 镁光
C300作为首款SATA 6Gbps的SSD主控，主控型号为Marvell 88SS9174-BJP2，固件由镁光开发。
目前还没有自家的Toolbox，SMART定义大致如下：（可能会变化）
ID 属性 解释
1 Raw Read Error Rate 底层数据读取出错率
5 Re-allocated Sectors Count 使用中新增的坏块数
9 Power On Hours Count 累计加电时间
12 Power Cycle Count 设备通电周期
170 Grown Failing Block Count 替换坏块计数
171 Program Fail Count 编程错误计数
172 Erase Fail Count 擦除错误计数
173 Wear Leveling Count 平均擦写次数
174 Unexpected Power Loss Count 不正常掉电次数
181 Non-4k Aligned Access 非4KB对齐访问数
183 SATA Interface Downshift 接口降级次数计数
187 Reported Uncorrectable Errors 不可修复错误计数
188 Command Timeout 指令超时计数
189 Factory Bad Block Count 出厂坏块计数
196 Re-allocation Event Count 坏块重映射事件计数
197 Current Pending Sector Count 值永远为0
198 Smart Off-line Scan Uncorrectable Error Count 自检时发现的不可修复错误
199 Ultra DMA CRC Error Rate 主机到接口之间传输CRC错误率
202 Percentage Of The Rated Lifetime Used 剩余寿命（MLC 5000 / SLC 100000计算)
百分比从100开始跌
206 Write Error Rate 底层数据写入出错率
我觉得最主要的是那个173/AD的值，那个值是平均块擦写次数，用户可以靠它判断自己的盘剩余寿命。
4. Indilinx
著名的韩国主控厂牌，主控特点为有着优秀的连续读写，家族有Barefoot, Barefoot Eco和Amigos.
Smart定义可以用官方工具查看。
大致定义的详细解释如下：
ID 属性 解释
1 Raw Read Error Rate 底层数据读取出错率
9 Power On Hours Count 累计加电时间
12 Power Cycle Count 设备通电周期
184 Init Bad Block Count 坏块数
195 Program Failure block Count 编程错误块计数
196 Erase Failure block Count 擦除错误块计数
197 Read Failure block Count 读取错误块计数（不可修复错误）
198 Total Count of Read Sectors 总读取页数
199 Total Count of Write Sectors 总写入页数
200 Total Count of Read Command 总读取指令数
200 Total Count of Write Command 总写入指令数
202 Total Count of error bits from flash 总闪存错误bit数
203 Total Count of Read Sectors with correct bits error 总修复bit错误的读取页数字
204 BAD Block Full Flag
205 Max P/E Count 最大可编程/擦除次数 MLC 5000/10000 or SLC 100000
206 Erase Count Min 最小擦写次数
207 Erase Count Max 最大擦写次数
208 Erase Count Average 平均擦写次数
209 Remaining Life % 剩余寿命百分比
210 BBM Error Log 坏块管理错误日志
211 SATA Error Count CRC (Write) SATA 主机 <->接口CRC写入错误计数
212 SATA Error Count HANDSHAKE (Read) SATA 主机 <->接口读取错误计数
标签：解释 crc increase last 编程 failure record cts win
原文地址：http://www.cnblogs.com/zengkefu/p/7123976.html
